NGIC posts sources sought for FT-IR Microscopy System
On December 4, the National Ground Intelligence Center posted a sources sought notice for an FT-IR Microscopy System (Solicitation Number: W26MT972961602). Responses are due by 3:00 p.m. Eastern on December 15.
The National Ground Intelligence Center has an FY18 requirement for one (1) FT-IR Microscopy System.
This is a Sources Sought Notice. This is not a Request for Proposal (RFP) or request for quote. This Sources Sought Notice in no way binds the Government to solicit or award a contract. No solicitation exists at this time and proposals are not being requested or accepted with this notice. Responses to this notice are not offers and cannot be accepted by the Government to form a binding contract. The information provided in this notice is subject to change and is not binding on the Government.
The instrument must be a stand-alone FT-IR microscope with an integrated FT-IR spectrometer. No FT-IR microscope coupled to an external FT-IR spectrometer will be accepted.
The objective of the FT-IR-microscope should include a motorized ATR crystal to accomplish fully automated measurements in ATR mode. The ATR crystal should be inserted in the objective during the visible inspection of the sample and during IR measurements in transmission and reflection. For data acquisition in ATR the crystal should be positioned automatically into the focus with high accuracy. An integrated pressure control shall ensure the constancy of the pressure applied from the crystal to the sample which is essential for mapping and imaging experiments. Different pressure steps should be selectable by software in order to achieve highest performance for all types of samples ranging from very soft to very hard. For background measurement the ATR crystal should be driven automatically in the focus position without sample contact. The ATR crystal should be made from Germanium in order to analyze also dark samples.
Full information and specifications are available here.